Thermal Infrared Microscopy (TIM)
Miniaturisation is continuing apace in many sectors, in particular in the electronics industry. This also increases the quality demands on the components – non-destructive testing is only possible with high local resolution IR systems.
The TIM IR camera has very small detector pixels and a large number of lines and columns. With special microscope optics, this permits spatial resolution of up to 3 µm.
The benefits of thermal IR microscopy (TIM):
- Local resolution of up to 3 µm, with 1 µm solid immersion lens (SIL)
- TemperatureTemperature
Measure of thermal energy density resolution up to < 10 µK - Real-time lock-in and run-time optimised algorithms for improved thermal and spatial
- Measurement of power densities ("Hot Spots") in semiconductor components that lead to early failure or reduced efficiency
- Surface inspection of metallic components AND technical films (micro-hole recognition)